A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

• Tobias Meier,
• Alexander Förste,
• Ali Tavassolizadeh,
• Karsten Rott,
• Dirk Meyners,
• Roland Gröger,
• Günter Reiss,
• Eckhard Quandt,
• Thomas Schimmel and
• Hendrik Hölscher

Beilstein J. Nanotechnol. 2015, 6, 451–461, doi:10.3762/bjnano.6.46

• effects; magnetostriction; scanning probe microscopes and components; Introduction Since its invention in the 1980s [1] the atomic force microscope (AFM) became a versatile tool frequently used in nanoscale metrology, biosensing, maskless lithography and high density data storage with nearly as many